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Vanadia was deposited on TiO2, ZrO2, HfO2, Nb2O5, and Ta2O5 supports using impregnation with either an oxalic acid solution of NH4VO3 or a solution of vanadyl acetylacetonate in ethanol. Prepared samples, with a nominal vanadia content in the range 0.5–2 monolayers, were characterized with X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), Raman and infrared spectroscopy, and were us
